Hassan N. Al-Obaidi, Imad H. Khaleel, The Beam Current Considerations in SEM Accordance to Mirror Effect Phenomenon, Volume 15, International Letters of Chemistry, Physics and Astronomy (Volume 15)
https://www.scipress.com/ILCPA.15.70
Abstract:
    A theoretical investigation have been presented to exploring the influence of electrons beam current on the electron mirror image deduced inside the scanning electron microscope (SEM). A rough mathematical expression for the electric potential that associated with electron beam is derived. The results clearly shows that the beam current could be used to enhance or conversely deteriorate the phenomena of mirror effect. So this work procedure may consider to be tool controllable of this phenomena for investigation purposes.
Keywords:
    Electron Beam Current, Electron Mirror Images, Scanning Electron Microscope