Structural and Optical Properties of Mn-Doped ZnO Thin Films Prepared by SILAR Method

Karunakaran, Marimuthu; Maheswari, S.; Kasirajan, Kasinathan; Dinesh Raj, Sivaji; Chandramohan, Rathinam

doi:10.18052/www.scipress.com/ILCPA.73.22

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Structural and Optical Properties of Mn-Doped ZnO Thin Films Prepared by SILAR Method

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Abstract:

The growth of highly textured Mn doped Zinc oxide (ZnO) thin films with a preferred (002) orientation has been reported by employing successive ionic layer growth by adsorption reaction (SILAR) using a sodium zincate bath on glass substrates has been reported. The prepared films were characterized by X-ray diffraction (XRD), optical spectroscopy and scanning electron microscopy (SEM) measurement. The XRD analysis reveals that the films were polycrystalline. Morphology of the films was found to be uniform with smaller grains and exhibits a structure with porous. The calculated Band gap value was found to be 3.21 eV prepared at 15 mM MnSO₄ concentration.

Info:

Periodical:

International Letters of Chemistry, Physics and Astronomy (Volume 73)

Pages:

22-30

DOI:

https://doi.org/10.18052/www.scipress.com/ILCPA.73.22

Citation:

M. Karunakaran et al., "Structural and Optical Properties of Mn-Doped ZnO Thin Films Prepared by SILAR Method", International Letters of Chemistry, Physics and Astronomy, Vol. 73, pp. 22-30, 2017

Online since:

April 2017

Authors:

Marimuthu Karunakaran, S. Maheswari, Kasinathan Kasirajan, Sivaji Dinesh Raj, Rathinam Chandramohan

Keywords:

Band Gap, Mn-Doped ZnO, Morphological Studies, SILAR, Structural Studies

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Open Access

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Creative Commons Attribution 4.0 International License

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