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J. Stangl, V. Holý, G. Bauer, Rev. Mod. Phys. 76 (2004) 725-783.
C. Prior, Journal of Applied Physics 83 (1997) 2548-2553.
J. R. Downs, D. A. Faux, E. P. O'reilly, Journal of Applied Physics 81 (1997) 6700-6702.
A. D. Andreev, J. R. Downs, D. A. Faux, E. P. O'reilly, Journal of Applied Physics 86 (1999) 297-305.
D. A. Faux, G. S. Pearson, Journal of Applied Physics 62 (2000) 4798-4801. G. S. Pearson, D. A. Faux, Journal of Applied Physics 88 (2000) 730-736.
R. Maranganthi, P. Sharma, A Review of strain field calculation in embedded quantum dots and wires, Handbook of Theoretical and Computational Nanotechnology Edited by Michael Rieth and Wolfram Schommers (American Scientific Publishers, 2005) Chapter 118, Volume 1: Pages (1-44). ISBN: 1-58883-042-X.
C. Y. Wang, M. Denda, E. Pan, International Journal of Solids and Structures, Vol. 43 ( 2006) 7593-7608.
J. Chu, J. Wang, Journal of Applied Physics 98 (2005) 1-7.
S. A. Komarov, Potential of strain induced semiconductor quantum dots for device applications, Ph.D. thesis, Stanford University (2002).
J. D. Eshelby, Elastic inclusions and inhomogeities, Edited by I. N. Sneddon, R. Hill (North Holland, 1961), Progress in Solid Mechanics, Vol. 2 pp.89-140.
T. Mura, Micromechanics of defects in solids (Martinus Nijhoff, Dordrecht, 1987) 2 nd edition.
L. D. Landau, E. M. Lifshitz, The Classical Theory of Fields., (Butterworth Heinemann, 1980) Vol. 2.