Paper Titles in Periodical
International Letters of Chemistry, Physics and Astronomy
Volume 64

Subscribe

Subscribe to our Newsletter and get informed about new publication regulary and special discounts for subscribers!

ILCPA > Volume 64 > Sensing Properties of WO3 as Thin Film Prepared by...
Sensing Properties of WO<sub>3</sub> as Thin Film Prepared by PVD towards Methanol Vapor
< Back to Volume

Sensing Properties of WO3 as Thin Film Prepared by PVD towards Methanol Vapor

Full Text PDF

Abstract:

Three thin films were prepared by PVD starting from WO3 powder with thicknesses (998.7, 1620, 2240 nm) respectively on glass substrates under limited thermal and pressure conditions, studied their I-V characteristics and calculated the sensitivity for 100 ppm of METHANOL vapor adsorption (The temperature of the films have been changed from 25°C to 350°C). A comparison among them was achieved at 300 °C as an operating degree and found that the 1620 nm WO3 has more sensitivity and has more power to adsorb for methanol vapor on it.

Info:

Periodical:
International Letters of Chemistry, Physics and Astronomy (Volume 64)
Pages:
27-33
DOI:
https://doi.org/10.18052/www.scipress.com/ILCPA.64.27
Citation:
M. Hbous "Sensing Properties of WO3 as Thin Film Prepared by PVD towards Methanol Vapor", International Letters of Chemistry, Physics and Astronomy, Vol. 64, pp. 27-33, 2016
Online since:
Feb 2016
Authors:
Mayada Hbous
Keywords:
Methanol Vapor, Sensing Properties, Thin Film, Tungsten Oxide WO3
Export:
RIS, BibTeX, Text
Distribution:
Open Access

Creative Commons License
This work is licensed under a
Creative Commons Attribution 4.0 International License

References:

[1] I. Blaszczyk-Lezak, A. M. Wrobel, T. Aoki, Y. Nakanishi, I. Kucinska, A. Tracz., Thin Solid Films 497 (2006) 24 – 34.

[2] M. Sherif. El-Eskandarany, emissions the national council of culture and arts and literature in Kuwait (2010) Page 325.

[3] Gil-Su Kim, Young Jung Lee, Dae-Gun Kim, Young Do Kim., Journal of Alloys and Compounds 454 (2008) 327–330.

[4] Dae-Gun Kim, Kyung Ho Min, Si-Young Chang, Sung-Tag Oh, Chang-Hee Lee., Young Do Kim., Materials Science and Engineering A 399 (2005) 326–331.

[5] C. V. Ramana, S. Utsunomiya, R. C. Ewing, C. M. Julien, and U. Becker., J. Phys. Chem. B 110, (2006) 10430-10435.

[6] T. A. Miller, S. D. Bakrania, C. Perez, M. S. Wooldridge ISBN: 1-58883-067-5, University of Michigan, Ann Arbor, Michigan 48109-2125, USA, Pages: 1–24.

[7] S. Saloum and B. Alkhaled., ACTA PHYSICA POLONICA A. Vol. 117, No. 3 (2010), 484-489.

[8] Chengxiang Wang, Longwei Yin, Luyuan Zhang, Dong Xiang and RuiGao. Sensors 10 (2010), 2088-2106.

[9] Gwan-Hyoung Lee, Shinhoo Kang., Journal of Alloys and Compounds 419 (2006) 281–289.

[10] Wael Abdullah, International Letters of Chemistry, Physics and Astronomy Vol. 56 (2015) pp.175-183.

[11] Nicholas Strandwitz; Stephen fornash; Handong Li, NNUN REU Program at Pennsylvania State Nanofabrication Facility, USA (2003). pp.68-69.

[12] S. Khoshnevis, R.S. Dariani, M.E. Azim-Araghi, Z. Bayindir, K. Robbie., Thin Solid Films 515 (2006) 2650–2654.

[13] Deliang Chen, Xianxiang Hou, Hejing Wen, Yu Wang, Hailong Wang, Xinjian Li, Rui Zhang, Hongxia Lu, Hongliang Xu, Shaokang Guan, Jing Sun and Lian Gao., Nanotechnology 21 (2010) 035501 (12pp).

[14] Ahmad Al Mohammad; Vacuum 83, (2009) pp.1326-1332.

[15] Hbous Mayada., Magazine ALBaath University Pdh thesis 2015 Pages 159.

Show More Hide