This work is licensed under a
Creative Commons Attribution 4.0 International License
 S. H. Lim, et al. Light and Lighting Conference with Special Emphasis on LEDs and Solid State Lighting, Budapest, 27-29 May (2009).
 R. Karlicek, High-power LED packaging., Conference on Lasers and Electro-Optics. Optical Society of America, 2005, pp.337-339.DOI: https://doi.org/10.1109/cleo.2005.201771
 IES Testing Procedures Committee. IES LM-80-08, IES Approved Method for Measuring Lumen Maintenance or LED Light Sources, New York., Illuminating Engineering Society of North America (2008).
 M. Ott, Capabilities and reliability of LEDs and laser diodes., Internal NASA Parts and Packaging Publication (1996).
 Y. Gu, N. Narendran, and J. P. Freyssinier, White LED performance., Optical Science and Technology, the SPIE 49th Annual Meeting. International Society for Optics and Photonics, 2004, pp.119-124.
 J. S. Jeong, J. K. Jung, and S. D. Park, Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED., Microelectronics Reliability 48. 8 (2008): 1216-1220.DOI: https://doi.org/10.1016/j.microrel.2008.07.029
 C. M. Tan, et al. Humidity effect on the degradation of packaged ultra-bright white LEDs., Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th. IEEE, 2008, pp.923-928.DOI: https://doi.org/10.1109/eptc.2008.4763548
 T. Yanagisawa, and T. Kojima, Long-term accelerated current operation of white light-emitting diodes., Journal of luminescence 114. 1 (2005): 39-42.DOI: https://doi.org/10.1016/j.jlumin.2004.11.010
 E. S. Schlig, Electrothermal considerations in display applications of light-emitting diodes., Electron Devices, IEEE Transactions on 19. 7 (1972): 847-851.DOI: https://doi.org/10.1109/t-ed.1972.17508
 N. Narendran, et al. Long-term performance of white LEDs and systems., Proceedings of First International Conference on White LEDs and Solid State Lighting. 2007, pp.174-179.
 Sematech, N. I. S. T. Engineering statistics handbook., (2006).
 K. Pommer, Reliability Study of GaAs, 63P. 37 LED'S., Reliability Physics Symposium, 1975. 13th Annual. IEEE, 1975, pp.200-206.DOI: https://doi.org/10.1109/irps.1975.362695
 L. Trevisanello, et al. Accelerated life test of high brightness light emitting diodes., Device and Materials Reliability, IEEE Transactions on 8. 2 (2008): 304-311.DOI: https://doi.org/10.1109/tdmr.2008.919596
 E. Hong, and N. Nadarajah, A method for projecting useful life of LED lighting systems. " Optical Science and Technology, SPIE, s 48th Annual Meeting. International Society for Optics and Photonics, 2004, pp.93-99.
 STANDARD, Integrated Circuits Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device), EIA/JESD51-1, December 1995. ( Received 23 March 2015; accepted 07 April 2015 ).