Subscribe

Subscribe to our Newsletter and get informed about new publication regulary and special discounts for subscribers!

ILCPA > Volume 27 > Effect of Substrate Temperature on Structural and...
< Back to Volume

Effect of Substrate Temperature on Structural and Optical Properties of CdO Thin Films

Full Text PDF

Abstract:

Thin films of CdO have been prepared by spray pyrolysis technique. XRD analysis reveals that all the prepared samples were polycrystalline and have preferred orientation along [111] orientation. The surface topography was determined by AFM which indicate that surface roughness and rms roughness were increased by the increasing of substrate temperature. The optical energy gap were determined and its value lies between (2.4-2.5) eV.

Info:

Periodical:
International Letters of Chemistry, Physics and Astronomy (Volume 27)
Pages:
47-55
DOI:
10.18052/www.scipress.com/ILCPA.27.47
Citation:
H. R.A. Ali "Effect of Substrate Temperature on Structural and Optical Properties of CdO Thin Films", International Letters of Chemistry, Physics and Astronomy, Vol. 27, pp. 47-55, 2014
Online since:
Feb 2014
Authors:
Export:
Distribution:
References:

R. S. Rusu, G. I. Rusu, J. Optoelctronics and Advanced Materials 7 (2005) 1511.

A. A. Dakhel, J. Material Science 46 (2004) 6925.

A. A. Dakhel, A. Y. Ali-Mohamed, J. Sol-Gel Sci. Technol. 44 (2007) 241.

R. Maity, K. K. Chattopadhy, Sol. Energy Mater. Sol. Cells 90 (2006) 597.

B. J. Lokhande, P. S. Patil, M. D. Uplane, Mater. Chem. Phys. 84 (2004) 238.

K. Matsubara, P. Fons, K. Iwata, A. Yamada, K. Sakurai, H. Tampo, S. Niki, Thin Solid Films 341 (2008) 369.

F. Z. Henori, A. A. Dakhel, Laser Phys. 18 (2008) 1557.

R. R Salunkhe, D. S. Dhawala, P. P. Dunai, C. D. Lokhande, Sens. Actuators B 140 (2009) 86. 300 400 500 600 700 800 900 1. 0 1. 5 2. 0 2. 5 3. 0 3. 5 4. 0 4. 5 5. 0 5. 5 350 oC 400 oC 450 oC Refractive Index Wavelength nm.

R. Srinivasaraghavan, R. Chandiramouli, B. G. Teyaprakosh, S. Seshadri, Spectrochimica Acta Part A: Molecular and Bio Molecular Spectroscopy 102 (2013) 242.

N. Ueda, H. Maeda, H. Ozono, H. K. Awazoe, J. Appl. Phys. 84 (1998) 6174.

Wei-Min Cho, Guan-Ru He, Ting-Hong Su, Yow-Jon Jin, Applied Surface Science 258 (2012) 4632.

A. A. Ziabari, F. E. Ghodsi, G. Kiriakidis, Surface Coating Technology 213 (2012) 15.

A. S. Kamble, R. C. Pawar, J. Y. Patil, S. S. Suryavanshi, P. S. Patil, J. Alloy Comp. 509 (2011) 1035.

D. lanb, S. J. C. Irvine, J. Cryst. Growth 332 (2011) 17.

V. Biligin, I. A kyuz, S. Kose, F. Atay, Semicond. Sci. Technol. 21 (2006) 579.

E. F. Kaelble, Handbook of X-rays for diffraction, emission, absorption, and microscopy. McGraw-Hill, New York, (1967) p.5.

Sudjaatmoko, Wirjoadi, B. Siswanto, Atom Indonesia 35 (2009) 115.

M. R. A. Bhyiyan, M. A. H. Miah, J. Begum, J. Bangladesh Academy of Science 36 (2012) 233.

J. Tauc, Amorphous and Liquid Semiconductors, Plenum Press London, (1974).

Nadir Fadhil Habubi, Sami Salmann Chiad, Saad Farhan Oboudi, Ziad Abdulahad Toma, International Letters of Chemistry, Physics and Astronomy 4 (2013) 1-8.

Saad F. Oboudi, Nadir F. Habubi, Ghuson H. Mohamed, Sami S. Chiad, International Letters of Chemistry, Physics and Astronomy 8(1) (2013) 78-86.

J. A. Najim, J. M. Rozaiq, International Letters of Chemistry, Physics and Astronomy 10(2) (2013) 137-150.

Majid H. Hassouni, Khudheir A. Mishjil, Sami S. Chiad, Nadir F. Habubi, International Letters of Chemistry, Physics and Astronomy 11 (2013) 26-37.

K. K. Patankar, International Letters of Chemistry, Physics and Astronomy 1 (2014) 1-8. ( Received 24 January 2014; accepted 29 January 2014 ).

Show More Hide