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Structural, Morphological and Optical Characterization of SnO2:F Thin Films Prepared by Chemical Spray Pyrolysis

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Abstract:

Fluorine doped tin oxide (FTO) films were successfully prepared on glass and quartz substrate at a substrate temperature equal to 450 °C for different fluorine doping (0, 0.05, 0.1, 0.15) by a homemade spray pyrolysis technique. The spray solution prepared from tin tetrachloride pentahydrate (SnCl4 · 5H2O) dissolved in distilled water at (0.1 M) concentration and ammonium fluoride (NH4F) was added into the solution for fluorine doping. X-ray diffraction patterns of the spray-deposited (SnO2: F) films for different fluorine doping show that all the diffractograms contain the characteristic SnO2 orientations. The matching of the observed and standard d-values confirm that the deposited films are of tin oxide with tetragonal structure and the films are polycrystalline with (110) as a preferred growth orientation. The surface morphology of SnO2: F thin film has been examined by atomic force microscopy (AFM). The average transmittance in the visible region (at 550 nm) has been found (40%, 47%, 52%, 59%, 61%) for the fluorine doping (0, 0.05, 0.1, 0.15, 0.2) respectively.

Info:

Periodical:
International Letters of Chemistry, Physics and Astronomy (Volume 18)
Pages:
90-102
DOI:
https://doi.org/10.18052/www.scipress.com/ILCPA.18.90
Citation:
S. A. Yousif and J. M. Abass, "Structural, Morphological and Optical Characterization of SnO2:F Thin Films Prepared by Chemical Spray Pyrolysis", International Letters of Chemistry, Physics and Astronomy, Vol. 18, pp. 90-102, 2013
Online since:
Sep 2013
Authors:
Salam Amir Yousif, Jenan Mohamed Abass
Keywords:
Diffraction, Optical Characterization, SnO2, SnO2:F, X-Ray
Export:
RIS, BibTeX, Text
Distribution:
Open Access

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This work is licensed under a
Creative Commons Attribution 4.0 International License

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