Paper Titles in Periodical
International Letters of Chemistry, Physics and Astronomy
Volume 15


Subscribe to our Newsletter and get informed about new publication regulary and special discounts for subscribers!

ILCPA > Volume 15 > The Beam Current Considerations in SEM Accordance...
< Back to Volume

The Beam Current Considerations in SEM Accordance to Mirror Effect Phenomenon

Full Text PDF


A theoretical investigation have been presented to exploring the influence of electrons beam current on the electron mirror image deduced inside the scanning electron microscope (SEM). A rough mathematical expression for the electric potential that associated with electron beam is derived. The results clearly shows that the beam current could be used to enhance or conversely deteriorate the phenomena of mirror effect. So this work procedure may consider to be tool controllable of this phenomena for investigation purposes.


International Letters of Chemistry, Physics and Astronomy (Volume 15)
H. N. Al-Obaidi and I. H. Khaleel, "The Beam Current Considerations in SEM Accordance to Mirror Effect Phenomenon", International Letters of Chemistry, Physics and Astronomy, Vol. 15, pp. 70-75, 2013
Online since:
Sep 2013

Robert L. E., Scanning electron microscopy and X-ray microanalysis, Prentice-Hall, (1993).

Novikov Y. A., Rakov A. V., Russia, Microelectronics 25(6) (1996) 375-383.

Egerton R.F., Malac P. M., Micron 35 (2004) 399-409.

Chad P., Dale B., Curt P., Phillip R., Microscopy and Analysis 21(5) (2007) 11-13.

Okai N. and Sohda Y., Jap. J. Appl. Phys. 52 (2012) 06FB11.

Ghorbel N., Kallel A., Dammame G., Renoud R., Fakhakh Z., Electrets, ISE-12 12th International Symposium, (2005) 235-238.

Al-Obaidi H. N., Al-Saymary F. A., Ali A. A., Proc. Summ. Scho., Sep. 8th Oct. 8th, Milano, Italy, (2008).

Croccolo F., Riccardi C., J. Microscopy 229(1) (2008) 39-43.

Abbood T. H., Formal Investigation of the Mirror Effect in SEM., Ph.D. thesis, University of Al-Mustansiriyah, College of Education, Baghdad, Iraq, (2011).

Milani M., Abdul-Wahab H. N., Abbood T. H., Savoia C., Tatti F., Sci., Tech. and Edu. (2010) 1741-1754.

Belhaj M., Jbara O., Odof S., Msellak K., Rau E., Andrianov M., Scanning 88 (2008) 352-374.

Belhaj M., Odof S., Msellak K., Jbara O., J. Appl. Phys. 88(5) (2000b).

Milani M., Savoia C., Bigoni D., Proceedings of ITP2009, Interdisciplinary Transport Phenomena VI: Fluid, Thermal, Biological, Materials and Space Sciences, Volterra, Italy (2009).

Hassan N., Imad H. Khalele, Huda K. Husien, Influnce of Electron Beam Charactaristics on the Electron Mirror Images of SEM , under publication, 2013. ( Received 23 May 2013; accepted 27 May 2013 ).

Show More Hide