Measurement Technology and Intelligent Instruments VIII
Key Engineering Materials Volumes 381 - 382
doi:10.4028/0-87849-382-4
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p3
Engineering Nanotechnology: The Top Down Approach
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643 K
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Authors: Robert J. Hocken, R. Fesperman, J. Overcash, O. Ozturk, C. Stroup
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p7
Dimensional Measurements for Micro- and Nanotechnology
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229 K
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Authors: Gao Liang Dai, F. Pohlenz, H.U. Danzebrink, L. Koenders
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p11
Recent Advances in our Research on Ultrahigh Resolution Laser Confocal Microscopy
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236 K
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Authors: Jiu Bin Tan, Jian Liu
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p15
Reliable Detection of Periodic Micro Structures on Open Surfaces
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283 K
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Authors: F. Härtig, Michael Paul Krystek, S. Klein
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p19
The Assessment of Functional Properties of Surfaces with Morphological Operations
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927 K
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Authors: Michael Dietzsch, S. Gröger, M. Gerlach, Michael Paul Krystek
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p23
Tactile and Optical Microsensors - Test Procedures and Standards
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2 M
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Authors: Ulrich Neuschaefer-Rube, Michael Neugebauer, W. Ehrig, M. Bartscher, U. Hilpert
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p27
Simulation of Light Scattering from Nanostructured Surfaces
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731 K
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Authors: Andreas Tausendfreund, S. Patzelt, S. Simon, G. Goch
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p31
Characterization and Manipulation of Boron Nanowire inside SEM
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229 K
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Authors: Ming Chang, C.H. Lin, Juti Rani Deka
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p35
AFM with the Slope Compensation Technique for High-Speed Precision Measurement of Micro-Structured Surfaces
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3 M
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Authors: Yu Guo Cui, Bing Feng Ju, J. Aoki, Yoshikazu Arai, Wei Gao
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p39
Compact Displacement Measurement System Based on Microchip Nd:YAG Laser with Birefringence External Cavity
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269 K
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Authors: Y. Tan, S. Zhang